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Browsing by Author "El-Sayed, Al-Moatasem Bellah"

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    Publication

    Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

    Tyaginov, Stanislav  
    ;
    Makarov, Alexander
    ;
    El-Sayed, Al-Moatasem Bellah
    ;
    Vaisman Chasin, Adrian  
    Proceedings paper
    2022, IEEE International Reliability Physics Symposium (IRPS), MAR 27-31, 2022

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