Publication:

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

Date

2022
Proceedings Paper
https://doi.org/10.1109/irps48227.2022.9764515
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Author(s)

Tyaginov, Stanislav  
;
Makarov, Alexander
;
El-Sayed, Al-Moatasem Bellah
;
Vaisman Chasin, Adrian  
;
Bury, Erik  
;
Jech, Markus
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
De Keersgieter, An  
;
Vexler, Mikhail
;
Eneman, Geert  
;
Kaczer, Ben  

Journal

na

Abstract

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