Publication:

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764515

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Author(s)

Tyaginov, Stanislav

;

Makarov, Alexander

;

El-Sayed, Al-Moatasem Bellah

;

Vaisman Chasin, Adrian

;

;

;

Vandemaele, Michiel

;

Grill, Alexander

;

De Keersgieter, An

;

Vexler, Mikhail

;

;

Journal

na

Metrics

1236 since deposited on 2023-02-27

Acq. date: 2025-12-13