Publication:
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Makarov, Alexander | |
| dc.contributor.author | El-Sayed, Al-Moatasem Bellah | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Jech, Markus | |
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.author | Vexler, Mikhail | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.date.accessioned | 2023-06-14T10:24:57Z | |
| dc.date.available | 2023-02-27T03:28:48Z | |
| dc.date.available | 2023-06-14T10:24:57Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764515 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41189 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 8 | |
| dc.subject.keywords | INTERFACE DEFECTS | |
| dc.subject.keywords | NANOWIRE FET | |
| dc.subject.keywords | HYDROGEN | |
| dc.subject.keywords | ENERGY | |
| dc.subject.keywords | TRANSCONDUCTANCE | |
| dc.subject.keywords | PASSIVATION | |
| dc.subject.keywords | RELIABILITY | |
| dc.subject.keywords | PERFORMANCE | |
| dc.subject.keywords | KINETICS | |
| dc.subject.keywords | FINFET | |
| dc.title | Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |