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Browsing by Author "El-Sayed, E.-M."

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    Modeling the effect of random dopants on hot-carrier degradation in FinFETs

    Makarov, A.
    ;
    Kaczer, Ben  
    ;
    Roussel, Philippe  
    ;
    Vaisman Chasin, Adrian  
    ;
    Grill, A.
    Proceedings paper
    2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.1-7

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