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Conference contributions
Modeling the effect of random dopants on hot-carrier degradation in FinFETs
Publication:
Modeling the effect of random dopants on hot-carrier degradation in FinFETs
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Date
2019
Proceedings Paper
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40243.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Makarov, A.
;
Kaczer, Ben
;
Roussel, Philippe
;
Vaisman Chasin, Adrian
;
Grill, A.
;
Vandemaele, Michiel
;
Hellings, Geert
;
El-Sayed, E.-M.
;
Grasser, Tibor
;
Linten, Dimitri
;
Tyaginov, Stanislav
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1940
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations
Metrics
Views
1940
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations