Browsing by Author "Ervin, J."
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Publication Modeling of tone inversion process flow for N5 interconnect to characterize block tip to tip
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3Publication Process variation analysis of device performance using virtual fabrication: methodology demonstrated on a CMOS 14-nm FinFET vehicle
Journal article2020, IEEE Transactions on Electron Devices, (67) 12, p.5374-5380