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Browsing by Author "Fang, W"

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    On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires

    Cho, Moon Ju
    ;
    Hellings, Geert  
    ;
    Veloso, Anabela  
    ;
    Simoen, Eddy  
    ;
    Roussel, Philippe  
    ;
    Kaczer, Ben  
    Proceedings paper
    2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.366-369

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