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On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires
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On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Hellings, Geert
;
Veloso, Anabela
;
Simoen, Eddy
;
Roussel, Philippe
;
Kaczer, Ben
;
Arimura, Hiroaki
;
Fang, W
;
Franco, Jacopo
;
Matagne, Philippe
;
Collaert, Nadine
;
Linten, Dimitri
;
Thean, Aaron
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1849
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Acq. date: 2025-12-16
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Metrics
Views
1849
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-16
Citations