Publication:

On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires

Date

 
dc.contributor.authorCho, Moon Ju
dc.contributor.authorHellings, Geert
dc.contributor.authorVeloso, Anabela
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKaczer, Ben
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorFang, W
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMatagne, Philippe
dc.contributor.authorCollaert, Nadine
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-22T18:41:49Z
dc.date.available2021-10-22T18:41:49Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25078
dc.identifier.url\nt3\sherlock\proceedings\IEDM\IEDM2015\DATA\S14P05.PDF
dc.source.beginpage366
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2015
dc.source.conferencelocationWashington, D.C. USA
dc.source.endpage369
dc.title

On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: