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Browsing by Author "Farnaam, K."

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    Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thickness

    Wang, Wei-E
    ;
    Balooch, M.
    ;
    Claypool, C.
    ;
    Zawaideh, M.
    ;
    Farnaam, K.
    Journal article
    2009, Solid State Technology, (52) 6, p.18-21

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