Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thickness

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Author(s)

Wang, Wei-E

;

Balooch, M.

;

Claypool, C.

;

Zawaideh, M.

;

Farnaam, K.

Journal

Solid State Technology

Metrics

1852 since deposited on 2021-10-18

2last month

Acq. date: 2025-12-08