Publication:
Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thickness
Date
| dc.contributor.author | Wang, Wei-E | |
| dc.contributor.author | Balooch, M. | |
| dc.contributor.author | Claypool, C. | |
| dc.contributor.author | Zawaideh, M. | |
| dc.contributor.author | Farnaam, K. | |
| dc.date.accessioned | 2021-10-18T05:10:11Z | |
| dc.date.available | 2021-10-18T05:10:11Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0038-111X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16526 | |
| dc.source.beginpage | 18 | |
| dc.source.endpage | 21 | |
| dc.source.issue | 6 | |
| dc.source.journal | Solid State Technology | |
| dc.source.volume | 52 | |
| dc.title | Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thickness | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |