Browsing by Author "Farris, M."
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Publication Justifications for reducing HBM and MM ESD qualification test time
;Verhaege, Koen ;Robinson-Hahn, D. ;Russ, Christian ;Farris, M. ;Scanlon, J. ;Lin, D.Veltri, J.Journal article1996, Microelectronics and Reliability, 36, p.1715-1718Publication Recommendations to further improvements of HBM ESD component level test specifications
;Verhaege, Koen ;Russ, Christian ;Robinson-Hahn, D. ;Farris, M. ;Scanlon, J. ;Lin, DonVeltri, J.Proceedings paper1996, Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium, 10/09/1996, p.40-53