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Browsing by Author "Farris, M."

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    Justifications for reducing HBM and MM ESD qualification test time

    Verhaege, Koen
    ;
    Robinson-Hahn, D.
    ;
    Russ, Christian
    ;
    Farris, M.
    ;
    Scanlon, J.
    ;
    Lin, D.
    ;
    Veltri, J.
    Journal article
    1996, Microelectronics and Reliability, 36, p.1715-1718
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    Recommendations to further improvements of HBM ESD component level test specifications

    Verhaege, Koen
    ;
    Russ, Christian
    ;
    Robinson-Hahn, D.
    ;
    Farris, M.
    ;
    Scanlon, J.
    ;
    Lin, Don
    ;
    Veltri, J.
    Proceedings paper
    1996, Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium, 10/09/1996, p.40-53

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