Publication:

Justifications for reducing HBM and MM ESD qualification test time

Date

1996
Journal article
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Author(s)

Verhaege, Koen
;
Robinson-Hahn, D.
;
Russ, Christian
;
Farris, M.
;
Scanlon, J.
;
Lin, D.
;
Veltri, J.
;
Groeseneken, Guido  

Journal

Microelectronics and Reliability

Abstract

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1991 since deposited on 2021-09-29
Acq. date: 2025-10-23

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1991 since deposited on 2021-09-29
Acq. date: 2025-10-23

Citations