Publication:

Justifications for reducing HBM and MM ESD qualification test time

Date

1996
Journal article
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dc.contributor.authorVerhaege, Koen
dc.contributor.authorRobinson-Hahn, D.
dc.contributor.authorRuss, Christian
dc.contributor.authorFarris, M.
dc.contributor.authorScanlon, J.
dc.contributor.authorLin, D.
dc.contributor.authorVeltri, J.
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-29T15:48:16Z
dc.date.available2021-09-29T15:48:16Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1630
dc.source.beginpage1715
dc.source.endpage1718
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
dc.title

Justifications for reducing HBM and MM ESD qualification test time

dc.typeJournal article
dspace.entity.typePublication
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