Browsing by Author "Fernandez, Raul"
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Publication Experimental characterization of NBTI effect on pMOSFET and CMOS inverter
Proceedings paper2009-02, Spanish Conference on Electron Devices - CDE, 11/02/2009, p.231-233Publication Proof-of-concept structure for investigation of successive soft gate oxide breakdowns in two dimensions
Proceedings paper2007-07, 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 11/07/2007, p.87-90Publication Toward understanding the wide distribution of time scales in negative bias temperature instability
Proceedings paper2007, Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9, 6/05/2007, p.265-282