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Experimental characterization of NBTI effect on pMOSFET and CMOS inverter
Publication:
Experimental characterization of NBTI effect on pMOSFET and CMOS inverter
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Date
2009-02
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fernandez, Raul
;
Kaczer, Ben
;
Gago, J.
;
Rodriguez, Rosana
;
Nafria, Montserrat
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1929
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Acq. date: 2025-12-09
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Metrics
Views
1929
since deposited on 2021-10-17
2
last month
1
last week
Acq. date: 2025-12-09
Citations