Browsing by Author "Fichtner, P.F.P."

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In-situ TEM on He implantation induced defects in SiGe/Si

Luysberg, Martina
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Hueging, N.
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Urban, K.
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Buca, D.
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Holländer, B.
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Mantl, S.
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Morschbacher, M.
Proceedings paper
2004, Proceedings of the 13th European Microscopy Congress. Volume 2: Materials Sciences, 22/08/2004, p.377-378
Microstructure evolution effects of helium redistribution in as-implanted silicon and Si0.8Ge0.2/Si heterostructures

Morschbacher, M.J.
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da Silva, D.L.
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Fichtner, P.F.P.
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Oliviero, E.
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Behar, M.
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Zawislak, F.C.
Journal article
2004, Nuclear Instruments & Methods in Physics Research B, 219-220, p.703-707
Strain relaxation of pseudomorphic Si1-xGe/Si(100) heterostructures after Si+ ion implantation

Holländer, B.
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Buca, D.
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Mörschbächer, M.
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Lenk, St.
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Mantl, S.
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Herzog, H.J.
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Hackbarth, Th.
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Loo, Roger
Journal article
2004, Journal of Applied Physics, (96) 3, p.1745-1747
Strain relaxation of pseudomorphic Si1-xGex/Si(100) heterostructures by Si+ ion implantation

Holländer, B.
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Buca, D.M.
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Lenk, S.
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Mantl, S.
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Herzog, H.J.
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Hackbarth, T.
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Loo, Roger
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Caymax, Matty
Oral presentation
2004, 14th International Conference on Ion Beam Modification of Materials - IBMM