Browsing by Author "Fouchier, M."
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Publication Characterization and otimalization of 65nm CMOS technology using scanning spreading resistance microscopy
Meeting abstract2005, Proceedings of the 8th Int. Workshop on the Fabrication , Characterization and Modeling of Ultra Shallow Junctions in Semicond., 5/06/2005, p.55Publication Probing electrical properties of semiconductor structures on the nm-scale
Oral presentation2008, Seeing at the Nanoscale VI