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Probing electrical properties of semiconductor structures on the nm-scale
Publication:
Probing electrical properties of semiconductor structures on the nm-scale
Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Meuris, Marc
;
De Wolf, P.
;
Alvarez, D.
;
Hantschel, Thomas
;
Trenkler, T.
;
Fouchier, M.
;
Duhayon, Natasja
;
Polspoel, Wouter
;
Mody, Jay
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1878
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1878
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations