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Browsing by Author "Fukui, Nobuyuki"

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    Advanced PnR Logic Patterning Enabled by High-NA EUV Lithography

    Roy, Syamashree  
    ;
    Thiam, Arame
    ;
    Feurprier, Yannick
    ;
    Franke, Joern-Holger  
    ;
    Sah, Kaushik
    Proceedings paper
    2025, 2025 Conference on Optical and EUV Nanolithography, 2025-04-22, p.1342410-1
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    Pushing the Boundaries of random logic metal patterning with Low-n EUV Single Exposure

    Roy, Syamashree  
    ;
    Thiam, Arame
    ;
    Sah, Kaushik
    ;
    Feurprier, Yannick
    ;
    Fukui, Nobuyuki
    Proceedings paper
    2024, Optical and EUV Nanolithography XXXVII, 2024-02-26, p.129530X

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