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Browsing by Author "Fukuzaki, Yuzo"

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    A novel structure of MOSFET array to measure Ioff-Ion with high accuracy and high density

    Suzuki, Tsuyoshi
    ;
    Anchlia, Ankur
    ;
    Cherman, Vladimir  
    ;
    Oishi, Hidetoshi  
    ;
    Mori, Shigetaka
    Proceedings paper
    2015, International Conference on Microelectronic Test Structures - ICMTS, 23/03/2015, p.9-13
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    In-line monitoring test structure for Charge-Based Capacitance Measurement (CBCM) with a start-stop self-pulsing circuit

    Sawada, Ken
    ;
    Van der Plas, Geert  
    ;
    Mori, Shigetaka
    ;
    Cherman, Vladimir  
    ;
    Mercha, Abdelkarim  
    Proceedings paper
    2015, International Conference on Microelectronic Test Structures - ICMTS, 23/03/2015, p.145-149

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