Browsing by Author "Galloway, Ken"
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Publication Interface and border traps in Ge pMOSFETs
Meeting abstract2012, ECS Fall Meeting Symposium E6: High Purity Silicon 12, 7/10/2012, p.2637Publication Total-dose-irradiation and annealing responses of Ge-pMOSFETs
Oral presentation2010, IEEE Nuclear and Space Radiation Effects Conference - NSREC