Browsing by Author "Gao, R."
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Publication A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
Proceedings paper2015, VLSI Technology Symposium, 15/06/2015, p.T36-T37Publication ESD characterization of planar InGaAs devices
Proceedings paper2015, IEEE International Reliability Physics Symposium - IRPS, 19/04/2015, p.3f.1Publication Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 5/12/2016, p.778-781Publication RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
Proceedings paper2016, IEEE Symposium on VLSI Technology, 13/06/2016, p.122-123Publication Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Proceedings paper2016, IEEE Symposium on VLSI technology, 13/06/2016, p.32-33