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Browsing by Author "Geva, M."

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    Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy

    De Wolf, Peter
    ;
    Geva, M.
    ;
    Reynolds, C. L.
    ;
    Hantschel, Thomas  
    ;
    Vandervorst, Wilfried  
    ;
    Bylsma, R. B.
    Journal article
    1999, J. Vacuum Science and Technology A, (17) 4, p.1285-1288
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    Two-dimensional profiling of InP structures using scanning spreading resistance microscopy

    De Wolf, Peter
    ;
    Geva, M.
    ;
    Hantschel, Thomas  
    ;
    Vandervorst, Wilfried  
    ;
    Bylsma, R. B.
    Journal article
    1998, Applied Physics Letters, (73) 15, p.2155-2157

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