Browsing by Author "Geva, M."
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Publication Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy
;De Wolf, Peter ;Geva, M. ;Reynolds, C. L.; ; Bylsma, R. B.Journal article1999, J. Vacuum Science and Technology A, (17) 4, p.1285-1288Publication Two-dimensional profiling of InP structures using scanning spreading resistance microscopy
Journal article1998, Applied Physics Letters, (73) 15, p.2155-2157