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Articles
Two-dimensional profiling of InP structures using scanning spreading resistance microscopy
Publication:
Two-dimensional profiling of InP structures using scanning spreading resistance microscopy
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Peter
;
Geva, M.
;
Hantschel, Thomas
;
Vandervorst, Wilfried
;
Bylsma, R. B.
Journal
Applied Physics Letters
Abstract
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Acq. date: 2026-02-25
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1885
since deposited on 2021-09-30
1
last month
Acq. date: 2026-02-25
Citations