Publication:

Two-dimensional profiling of InP structures using scanning spreading resistance microscopy

Date

1998
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorDe Wolf, Peter
dc.contributor.authorGeva, M.
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorBylsma, R. B.
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2021-09-30T11:46:19Z
dc.date.available2021-09-30T11:46:19Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2518
dc.source.beginpage2155
dc.source.endpage2157
dc.source.issue15
dc.source.journalApplied Physics Letters
dc.source.volume73
dc.title

Two-dimensional profiling of InP structures using scanning spreading resistance microscopy

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
2929.pdf
Size:
162.29 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles