Browsing by Author "Ghibaudo, Gérard"
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Publication Mobility analysis of surface roughness scattering in FinFET devices
; ; Hoffmann, Thomas Y.Journal article2011, Solid-State Electronics, (62) 1, p.195-201Publication Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs
Proceedings paper2017, International Conference of Microelectronic Test Structures - ICMTS, 28/03/2017, p.1-5