Publication:
Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs
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1822 since deposited on 2021-10-24
2last month
Acq. date: 2026-04-06
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Statistics
Views
1822 since deposited on 2021-10-24
2last month
Acq. date: 2026-04-06
Citations