Publication:
Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs
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1820 since deposited on 2021-10-24
2last month
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Acq. date: 2026-01-07
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Views
1820 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-01-07
Citations