Browsing by Author "Gibki, J."
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Publication Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Meeting abstract1997, Belgische Natuurkundige Vereniging / Société Belge de Physique : General Scientific Meeting, 29/05/1997, p.CM35Publication Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
Proceedings paper1997, Proceedings of the 7th International Autumn Meeting : Gettering and Defect Engineering in Semiconductor Technology - GADEST '97, 5/10/1997, p.477-482Publication Metoda dokladnego wyznaczania parametrow polprzewodnika w zastosowaniu do pomiarow czasu zycia nosnikow i koncentracji domieszek / A method of accurate semiconductor parameters determination used for carrier lifetime and dopant concentration measurements
Proceedings paper1997, VI Konferencja Naukowa Technologia Elektronowa - ELTE, 6/05/1997, p.442-445Publication Optimised diode analysis of electrical silicon substrate properties
Proceedings paper1997, Crystalline Defects and Contamination Control: Their Impact and Control in Device Manufacturing II, 31/08/1997, p.218-227Publication Optimized diode analysis of electrical silicon substrate properties
Journal article1998, Journal of the Electrochemical Society, (145) 6, p.2107-2112