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Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
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1928 since deposited on 2021-09-30
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Acq. date: 2025-10-24
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Views
1928 since deposited on 2021-09-30
424item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations