Browsing by Author "Gielen, G."
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Publication A Carrier-Energy-based Compact Model for Hot-Carrier Degradation Implemented in Verilog-A
; ; ; ; ; Gielen, G.Proceedings paper2025, 2025 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2025-03-30Publication Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions
Proceedings paper2022, IEEE International Integrated Reliability Workshop (IIRW), OCT 09-14, 2022Publication European Test Symposium Teams: an Anniversary Snapshot