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Browsing by Author "Gielen, G."

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    Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions

    Sangani, Dishant  
    ;
    Diaz Fortuny, Javier  
    ;
    Bury, Erik  
    ;
    Kaczer, Ben  
    ;
    Gielen, G.
    Proceedings paper
    2022, IEEE International Integrated Reliability Workshop (IIRW), OCT 09-14, 2022

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