Publication:

Assessment of Transistor Aging Models in a 28nm CMOS Technology at a Wide Range of Stress Conditions

Date

2022

Proceedings Paper

https://doi.org/10.1109/IIRW56459.2022.10032756

Simple item page Full metadata Statistics

Author(s)

Sangani, Dishant

;

Diaz Fortuny, Javier

;

;

;

Journal

na

Metrics

1269 since deposited on 2023-05-26

Acq. date: 2025-12-15