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Browsing by Author "Gillon, R."

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    A fast and flexible thermal simulation tool validated on smart power devices

    Desoete, B.
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    Moens, P.
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    Driessens, Evelien
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    Elattari, Brahim
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    Van den Bosch, Geert  
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    Gillon, R.
    Proceedings paper
    2005-05, Proceedings International Symposium on Power Semiconductor Devices - ISPSD, 23/05/2005, p.111-114
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    A new charge based compact model for lateral asymmetric MOSFET and its application to high voltage MOSFET modeling

    Chauhan, Y.
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    Krummenacher, F.
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    Anghel, C.
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    Gillon, R.
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    Bakeroot, Benoit  
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    Declercq, M.
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    Ionescu, A.
    Proceedings paper
    2007-01, 20th International Conference on VLSI Design, 6/01/2007, p.177-182
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    An experimental approach for bias-dependent drain series resistance evaluation in asymmetric HV MOSFETs

    Hefyene, N.
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    Anghel, C.
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    Ionescu, A. M.
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    Frere, S.
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    Gillon, R.
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    Vermandel, Miguel
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    Bakeroot, Benoit  
    Proceedings paper
    2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.403-406
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    Compact modeling of lateral nonuniform doping in high-voltage MOSFETs

    Chauhan, Y.
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    Krummenacher, F.
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    Gillon, R.
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    Bakeroot, Benoit  
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    Declercq, M.
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    Ionescu, A.
    Journal article
    2007, IEEE Trans. Electron Devices, (54) 6, p.1527-1539
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    Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

    Gillon, R.
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    Van De Sype, Wim
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    Vanhoenacker, D.
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    Martens, Luc  
    Proceedings paper
    2000, International Conference on Microelectronic Test Structures - ICMTS, 13/03/2000, p.241-245
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    Electrical characterisation of high voltage MOSFETs using MESDRIFT

    Anghel, C.
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    Hefyene, N.
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    Vermandel, Miguel
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    Bakeroot, Benoit  
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    Doutreloigne, Jan  
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    Gillon, R.
    Proceedings paper
    2003, Proceedings International Semiconductor Conference, 28/09/2003, p.257-260
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    Investigations and physical modelling of saturation effects in lateral DMOS transistor architectures based on the concept of intrinsic drain voltage

    Anghel, C.
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    Hefyene, N.
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    Ionescu, A. M.
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    Vermandel, Miguel
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    Bakeroot, Benoit  
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    Doutrloigne, J.
    Proceedings paper
    2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.399-402
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    Wideband measurement system for on-chip ESD waveform characterisation

    Colman, G.
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    Bauwelinck, Johan  
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    Gillon, R.
    ;
    Wieers, A.
    ;
    Vandewege, Jan
    Journal article
    2012-02, Electronics Letters, (48) 3, p.150-152

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