Browsing by Author "Gorchichko, M."
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Publication Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics
;Gorchichko, M. ;Cao, Y. ;Zhang, E.X. ;Yan, D. ;Gong, H. ;Zhao, S.E. ;Wang, P. ;Jiang, R.Liang, C.Journal article2020, IEEE Transactions on Nuclear Science, (67) 1, p.245-252