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Browsing by Author "Gorchichko, M."

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    Publication

    Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics

    Gorchichko, M.
    ;
    Cao, Y.
    ;
    Zhang, E.X.
    ;
    Yan, D.
    ;
    Gong, H.
    ;
    Zhao, S.E.
    ;
    Wang, P.
    ;
    Jiang, R.
    ;
    Liang, C.
    Journal article
    2020, IEEE Transactions on Nuclear Science, (67) 1, p.245-252

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