Publication:
Total-ionizing-dose effects and low-frequency noise in 30-nm gate-length Bulk and SOI FinFETs with SiO2/HfO2 gate delectrics
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1936 since deposited on 2021-10-28
Acq. date: 2025-12-08
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Views
1936 since deposited on 2021-10-28
Acq. date: 2025-12-08
Citations