Browsing by Author "Guggenmos, X."
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Publication Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Journal article1994, Quality and Reliability Engineering International, 10, p.325-334Publication Electrothermal device simulation of a gg-nMOSt under HBM ESD conditions
;Russ, Christian ;Kreisbeck, J. ;Gieser, H. ;Guggenmos, X.Kanert, W.Proceedings paper1995, Proceedings of the 6th ESREF Conference, 3/10/1995, p.141-146