Browsing by Author "Gupta, Charu"
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Publication Characterization and modeling of hot carrier degradation in N-channel gate-all-around nanowire FETs
Journal article2020, IEEE Transactions on Electron Devices, (67) 1, p.4-10Publication Time Evolution of DIBL in Gate-All-Around Nanowire MOSFETs During Hot-Carrier Stress
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 6, p.2641-2646