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Time Evolution of DIBL in Gate-All-Around Nanowire MOSFETs During Hot-Carrier Stress
Publication:
Time Evolution of DIBL in Gate-All-Around Nanowire MOSFETs During Hot-Carrier Stress
Date
2021
Journal article
https://doi.org/10.1109/TED.2021.3075169
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Anshul
;
Gupta, Charu
;
Veloso, Anabela
;
Parvais, Bertrand
;
Dixit, Abhisek
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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1105
since deposited on 2023-06-20
Acq. date: 2025-10-24
Citations
Metrics
Views
1105
since deposited on 2023-06-20
Acq. date: 2025-10-24
Citations