Publication:
Time Evolution of DIBL in Gate-All-Around Nanowire MOSFETs During Hot-Carrier Stress
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1112 since deposited on 2023-06-20
3last month
Acq. date: 2026-10-12
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Statistics
Views
1112 since deposited on 2023-06-20
3last month
Acq. date: 2026-10-12
Citations