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Browsing by Author "Hübner, S."

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    New access to soft breakdown parameters of low k dielectrics through localization-based analysis

    Herfurth, Norbert
    ;
    Simon-Najasek, M.
    ;
    Herfurth, R.
    ;
    Hübner, S.
    ;
    Altmann, Frank
    ;
    Beyreuther, A.
    Proceedings paper
    2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019

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