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New access to soft breakdown parameters of low k dielectrics through localization-based analysis
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New access to soft breakdown parameters of low k dielectrics through localization-based analysis
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Herfurth, Norbert
;
Simon-Najasek, M.
;
Herfurth, R.
;
Hübner, S.
;
Altmann, Frank
;
Beyreuther, A.
;
Amini, E.
;
De Wolf, Ingrid
;
Wu, Chen
;
Croes, Kristof
;
Boit, Christian
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Acq. date: 2026-01-06
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Views
1907
since deposited on 2021-10-27
4
last month
1
last week
Acq. date: 2026-01-06
Citations