Browsing by Author "Hachtel, Jordan"

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Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Duan, Guo Xing
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Hachtel, Jordan
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Zhang, En Xia
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Zhang, Cher Xuan
;
Fleetwood, Daniel
Journal article
2016, IEEE Transactions on Device and Materials Reliability, (16) 4, p.541-548
Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

Mitard, Jerome
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Zhang, En Xia
;
Fleetwood, Daniel
;
Hachtel, Jordan
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Liang, Chundong
;
Reed, Robert
Meeting abstract
2016-07, IEEE Nuclear Space and Radiation Conference - NSREC, 13/07/2016