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Browsing by Author "Hall, Stephen"

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    Stress-induced positive charge in Hf-based gate dielectrics: impact on device performance and a framework for the defect

    Zhao, C.Z.
    ;
    Zhang, Jian F.
    ;
    Chang, Mo H.
    ;
    Peaker, Anthony R.
    ;
    Hall, Stephen
    ;
    Groeseneken, Guido  
    Journal article
    2008, IEEE Transactions on Electron Devices, (55) 7, p.1647-1656

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