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Browsing by Author "Hall, Steve"

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    Publication

    The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique

    Chai, Zheng
    ;
    Zhang, Weidong
    ;
    Freitas, Pedro  
    ;
    Hatem, Firas
    ;
    Zhang, Jian Fu
    ;
    Marsland, John
    Journal article
    2018, IEEE Electron Device Letters, (39) 7, p.955-958

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