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The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique
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1942 since deposited on 2021-10-25
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Acq. date: 2025-10-24
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Views
1942 since deposited on 2021-10-25
435item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations