Publication:

The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique

Date

2018

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

;

Govoreanu, Bogdan

;

;

Kar, Gouri Sankar

;

;

;

Robertson, john

Journal

IEEE Electron Device Letters

Metrics

1948 since deposited on 2021-10-25

Acq. date: 2025-12-10