Publication:

The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique

Date

2018

Journal article

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Author(s)

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Govoreanu, Bogdan

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Kar, Gouri Sankar

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Robertson, john

Journal

IEEE Electron Device Letters

Metrics

1948 since deposited on 2021-10-25

Acq. date: 2026-01-07