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Browsing by Author "Hansen, Olaf"

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    High precision micro-scale Hall effect characterization method using in-line micro four-point probes

    Petersen, Dirch
    ;
    Hansen, Olaf
    ;
    Clarysse, Trudo
    ;
    Goossens, Jozefien
    ;
    Rosseel, Erik  
    Proceedings paper
    2008, 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP, 30/09/2008, p.251-255

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