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High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Publication:
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Date
2008
Proceedings Paper
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17706.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petersen, Dirch
;
Hansen, Olaf
;
Clarysse, Trudo
;
Goossens, Jozefien
;
Rosseel, Erik
;
Vandervorst, Wilfried
;
Lin, Rong
;
Nielsen, Peter
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1925
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1925
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations