Browsing by Author "Haond, M"
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Publication Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elements
Proceedings paper2017, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS, 3/04/2017, p.228-230Publication Back-gate bias effect on UTBB-FDSOI non-linearity performance
Proceedings paper2017, 47th European Solid-State Device Research Conference - ESSDERC, 11/09/2017, p.148-151