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Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elements
Publication:
Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elements
Date
2017
Proceedings Paper
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35608.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kazemi Esfeh, Babak
;
Kilchytska, Valeria
;
Parvais, Bertrand
;
Planes, N.
;
Haond, M
;
Flandre, D
;
Raskin, J.-P.
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2057
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
2057
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations