Browsing by Author "Hartmann, Jean-Michel"
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Publication Ion channeling strain measurements of uniaxially strained Si/SiGe heterostructures on Si(110) and Si(110)
Meeting abstract2010, 17th International Conference on Ion Beam Modification of Materials - IBMM, 22/08/2010Publication Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam
;Hoenicke, Philipp ;Waehlisch, Andre ;Unterumsberger, RainerBeckhoff, BurkhardJournal article2024-JUL 8, NANOTECHNOLOGY, (35) 28, p.285702